The effect of mechanical stress and strain on the electrical properties of metal-oxide-semiconductor electronic devices

The effect of mechanical stress and strain on the electrical properties of metal-oxide-semiconductor electronic devices
Author: Trevor George Read
Publisher:
Total Pages:
Release: 1978
Genre:
ISBN:


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The effect of mechanical stress and strain on the electrical properties of metal-oxide-semiconductor electronic devices
Language: en
Pages:
Transport in Metal-Oxide-Semiconductor Structures
Language: en
Pages: 115
Authors: Hamid Bentarzi
Categories: Technology & Engineering
Type: BOOK - Published: 2011-01-12 - Publisher: Springer Science & Business Media

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This book focuses on the importance of mobile ions presented in oxide structures, what significantly affects the metal-oxide-semiconductor (MOS) properties. The
Oxide Electronics
Language: en
Pages: 624
Authors: Asim K. Ray
Categories: Technology & Engineering
Type: BOOK - Published: 2021-04-22 - Publisher: John Wiley & Sons

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Oxide Electronics Multiple disciplines converge in this insightful exploration of complex metal oxides and their functions and properties Oxide Electronics deli
Scientific and Technical Aerospace Reports
Language: en
Pages: 892
Authors:
Categories: Aeronautics
Type: BOOK - Published: 1994 - Publisher:

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Oxide Electronics and Functional Properties of Transition Metal Oxides
Language: en
Pages: 0
Authors: Alexander Pergament
Categories: Oxides
Type: BOOK - Published: 2014 - Publisher: Nova Science Publishers

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MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors) for a long time have been the workhorse of the modern electronics industry. For the purpose of a pe