Spectroscopy for Materials Analysis

Spectroscopy for Materials Analysis
Author: Kazuaki Wagatsuma
Publisher: Springer Nature
Total Pages: 105
Release: 2021-10-11
Genre: Technology & Engineering
ISBN: 981165946X


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This book includes X-ray fluorescence spectroscopy, electron spectroscopy, and atomic emission spectroscopy, which are now extensively employed in material analysis. This book is organized as a guide for undergraduate students and engineers who wish to study analytical spectroscopy in material science. An objective of this book is to explain the principles of those methods of spectroscopy only with basic mathematical expressions and to introduce their applications to actual materials.


Spectroscopy for Materials Analysis
Language: en
Pages: 105
Authors: Kazuaki Wagatsuma
Categories: Technology & Engineering
Type: BOOK - Published: 2021-10-11 - Publisher: Springer Nature

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This book includes X-ray fluorescence spectroscopy, electron spectroscopy, and atomic emission spectroscopy, which are now extensively employed in material anal
Surface Analysis Methods in Materials Science
Language: en
Pages: 588
Authors: D.J. O'Connor
Categories: Technology & Engineering
Type: BOOK - Published: 2013-06-29 - Publisher: Springer Science & Business Media

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This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated refer
Practical Materials Characterization
Language: en
Pages: 242
Authors: Mauro Sardela
Categories: Technology & Engineering
Type: BOOK - Published: 2014-07-10 - Publisher: Springer

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Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced use
Progress in Materials Analysis
Language: en
Pages: 378
Authors: M. Grasserbauer
Categories: Science
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level int
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Language: en
Pages: 544
Authors: Siegfried Hofmann
Categories: Science
Type: BOOK - Published: 2012-10-25 - Publisher: Springer Science & Business Media

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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on ty