Scanning Probe Microscopy for Energy Research

Scanning Probe Microscopy for Energy Research
Author: Dawn A. Bonnell
Publisher: World Scientific
Total Pages: 640
Release: 2013
Genre: Technology & Engineering
ISBN: 981443471X


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Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.


Scanning Probe Microscopy for Energy Research
Language: en
Pages: 640
Authors: Dawn A. Bonnell
Categories: Technology & Engineering
Type: BOOK - Published: 2013 - Publisher: World Scientific

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Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex elec
Scanning Probe Microscopy For Energy Research: Materials, Devices, And Applications
Language: en
Pages: 640
Authors: Dawn Bonnell
Categories: Science
Type: BOOK - Published: 2013-03-26 - Publisher: World Scientific

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Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex elec
Atomic Force Microscopy for Energy Research
Language: en
Pages: 457
Authors: Cai Shen
Categories: Science
Type: BOOK - Published: 2022-04-26 - Publisher: CRC Press

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Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase,
Scanning Probe Microscopy
Language: en
Pages: 1002
Authors: Sergei V. Kalinin
Categories: Technology & Engineering
Type: BOOK - Published: 2007-04-03 - Publisher: Springer Science & Business Media

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This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing
Scanning Probe Microscopy
Language: en
Pages: 215
Authors: Ernst Meyer
Categories: Science
Type: BOOK - Published: 2013-03-14 - Publisher: Springer Science & Business Media

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Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the expe