Roadmap of Scanning Probe Microscopy

Roadmap of Scanning Probe Microscopy
Author: Seizo Morita
Publisher: Springer Science & Business Media
Total Pages: 207
Release: 2006-12-30
Genre: Technology & Engineering
ISBN: 3540343156


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Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.


Roadmap of Scanning Probe Microscopy
Language: en
Pages: 207
Authors: Seizo Morita
Categories: Technology & Engineering
Type: BOOK - Published: 2006-12-30 - Publisher: Springer Science & Business Media

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Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for
Scanning Probe Microscopy
Language: en
Pages: 215
Authors: Ernst Meyer
Categories: Science
Type: BOOK - Published: 2013-03-14 - Publisher: Springer Science & Business Media

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Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the expe
Scanning Probe Microscopy of Functional Materials
Language: en
Pages: 563
Authors: Sergei V. Kalinin
Categories: Technology & Engineering
Type: BOOK - Published: 2010-12-13 - Publisher: Springer Science & Business Media

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The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization
Scanning Probe Microscopy
Language: en
Pages: 238
Authors: Roland Wiesendanger
Categories: Technology & Engineering
Type: BOOK - Published: 2013-03-14 - Publisher: Springer Science & Business Media

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Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe micros
Scanning Probe Microscopy
Language: en
Pages: 375
Authors: Bert Voigtländer
Categories: Technology & Engineering
Type: BOOK - Published: 2015-02-24 - Publisher: Springer

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This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operat