Purity Control of Semiconductors by the Method of Capacitance Transient Spectroscopy

Purity Control of Semiconductors by the Method of Capacitance Transient Spectroscopy
Author: Lev Solomonovich Berman
Publisher:
Total Pages: 122
Release: 1995
Genre: Semiconductors
ISBN:
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Purity Control of Semiconductors by the Method of Capacitance Transient Spectroscopy
Language: en
Pages: 122

Purity Control of Semiconductors by the Method of Capacitance Transient Spectroscopy

Authors: Lev Solomonovich Berman
Categories: Semiconductors
Type: BOOK - Published: 1995 - Publisher:

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Proceedings of the Fourth International Symposium on High Purity Silicon
Language: en
Pages: 606

Proceedings of the Fourth International Symposium on High Purity Silicon

Authors: Cor L. Claeys
Categories: Science
Type: BOOK - Published: 1996 - Publisher: The Electrochemical Society

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Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques
Language: en
Pages: 0

Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques

Authors: Semiconductor Equipment and Materials International
Categories: Semiconductors
Type: BOOK - Published: 2006 - Publisher:

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Semiconductors
Language: en
Pages: 400

Semiconductors

Authors:
Categories: Semiconductors
Type: BOOK - Published: 2008 - Publisher:

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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
Language: en
Pages: 76

Methods of Measurement for Semiconductor Materials, Process Control, and Devices

Authors: United States. National Bureau of Standards
Categories: Semiconductors
Type: BOOK - Published: 1969 - Publisher:

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