Phase Differentiation And Characterization Of Nanostructured Composites By Synchrotron Radiation Techniques

The complexity of nanostructured materials presents challenging difficulties in characterization using conventional techniques. For example, conventional x-ray diffraction may not provide accurate information on the structure (solid solution or phase separation) of nanostructured materials. Complementary advanced characterization methods are often required in the detailed understanding of structures. In this paper we report our work on characterization of two nanostructured systems, namely, AgNi powder and NiCo films, using synchrotron radiation techniques of x-ray diffraction, anomalous x-ray scattering and x-ray absorption spectroscopy.