Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry

Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry
Author: Danica Heller-Krippendorf
Publisher: Springer Nature
Total Pages: 195
Release: 2019-10-31
Genre: Science
ISBN: 3658285028


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Danica Heller-Krippendorf develops concepts and approaches optimizing the applicability of MVA on data sets from an industrial context. They enable more time-efficient MVA of the respective ToF‐SIMS data. Priority is given to two main aspects by the author: First, the focus is on strategies for a more time-efficient collection of the input data. This includes the optimal selection of the number of replicate measurements, the selection of input data and guidelines for the selection appropriate data preprocessing methods. Second, strategies for more efficient analysis of MVA results are presented. ​About the Author: Danica Heller-Krippendorf did her research and dissertation at the University of Siegen, Germany, in collaboration with a German analytical service company. Now she is engineer in analytics at a DAX company.


Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry
Language: en
Pages: 195
Authors: Danica Heller-Krippendorf
Categories: Science
Type: BOOK - Published: 2019-10-31 - Publisher: Springer Nature

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Danica Heller-Krippendorf develops concepts and approaches optimizing the applicability of MVA on data sets from an industrial context. They enable more time-ef
Time-of-flight Secondary Ion Mass Spectrometry
Language: en
Pages:
Authors: Joanna Lee
Categories:
Type: BOOK - Published: 2011 - Publisher:

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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative techno
Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files
Language: en
Pages: 43
Pre-processing Influences on Multivariate Data Analysis of Time-of-flight Secondary Ion Mass Spectroscopy Data and Images
Language: en
Pages: 400
Authors: Thérèse Gerri-Ann Lee
Categories: Multivariate analysis
Type: BOOK - Published: 2014 - Publisher:

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Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data
Language: en
Pages:
Authors: Negar Shahrokhesfahani
Categories: Multivariate analysis
Type: BOOK - Published: 2018 - Publisher:

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Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful tool for advanced surface analysis. It produces large data sets, which consist of mass s