Instabilities in MOS Devices

Instabilities in MOS Devices
Author: John Richard Davis
Publisher: CRC Press
Total Pages: 198
Release: 1981
Genre: Computers
ISBN: 9780677055909
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Instabilities in MOS Devices
Language: en
Pages: 198

Instabilities in MOS Devices

Authors: John Richard Davis
Categories: Computers
Type: BOOK - Published: 1981 - Publisher: CRC Press

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Negative-bias-temperature Instability (NBTI) in Mos Devices
Language: en
Pages: 198

Negative-bias-temperature Instability (NBTI) in Mos Devices

Authors:
Categories:
Type: BOOK - Published: 2005 - Publisher:

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Fundamentals of Bias Temperature Instability in MOS Transistors
Language: en
Pages: 282

Fundamentals of Bias Temperature Instability in MOS Transistors

Authors: Souvik Mahapatra
Categories: Technology & Engineering
Type: BOOK - Published: 2015-08-05 - Publisher: Springer

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This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circui
Reliability of MOS Devices
Language: en
Pages: 137

Reliability of MOS Devices

Authors: Sesha Rajamani Shankar
Categories: Field-effect transistors
Type: BOOK - Published: 1977 - Publisher:

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A very important factor in the reliability of MOS devices is the stability of the threshold voltage. This dissertation examines the effects of positive and nega
Defects in Microelectronic Materials and Devices
Language: en
Pages: 772

Defects in Microelectronic Materials and Devices

Authors: Daniel M. Fleetwood
Categories: Science
Type: BOOK - Published: 2008-11-19 - Publisher: CRC Press

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Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that eng