Handbook of X-Ray Spectrometry

Handbook of X-Ray Spectrometry
Author: Rene Van Grieken
Publisher: CRC Press
Total Pages: 1004
Release: 2001-11-27
Genre: Science
ISBN: 0203908708


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"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."


Handbook of X-Ray Spectrometry
Language: en
Pages: 1004
Authors: Rene Van Grieken
Categories: Science
Type: BOOK - Published: 2001-11-27 - Publisher: CRC Press

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"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchr
Handbook of X-Ray Data
Language: en
Pages: 969
Authors: Günter H. Zschornack
Categories: Technology & Engineering
Type: BOOK - Published: 2007-01-24 - Publisher: Springer Science & Business Media

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This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-
Handbook of X-Ray Spectrometry
Language: en
Pages: 1016
Authors: Rene Van Grieken
Categories: Science
Type: BOOK - Published: 2001-11-27 - Publisher: CRC Press

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"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchr
Handbook of Practical X-Ray Fluorescence Analysis
Language: en
Pages: 897
Authors: Burkhard Beckhoff
Categories: Science
Type: BOOK - Published: 2007-05-18 - Publisher: Springer Science & Business Media

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X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to
Handbook of X-Ray Spectrometry, Second Edition,
Language: en
Pages: 983
Authors: Rene Van Grieken
Categories: Science
Type: BOOK - Published: 2002 - Publisher: CRC Press

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This work updates applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron ra