Focusing of Charged Particles V2

Focusing of Charged Particles V2
Author: Albert Septier
Publisher: Elsevier
Total Pages: 487
Release: 2012-12-02
Genre: Science
ISBN: 0323148468


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Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. This book provides a detailed analysis of the principles of the laws of propagation of beams. Comprised of three parts encompassing three chapters, this volume starts with an overview of how a beam of charged particles traverses a region that is at a uniform, constant, electrostatic potential. This book then discusses the principle of charge repulsion effect by which the space charge of the beam modifies the potential in the region that it traverses. Other chapters examine the general design techniques and performances obtainable for electron guns applicable for use in initiating a beam for linear beam tubes that is given in a condensed form. The last chapter deals with the two stable charged particles that can be accelerated, namely, protons and electrons. This book is a valuable resource to physicists, accelerator experts, and experimenters in search of interactions in the detector target.


Focusing of Charged Particles V2
Language: en
Pages: 487
Authors: Albert Septier
Categories: Science
Type: BOOK - Published: 2012-12-02 - Publisher: Elsevier

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Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. Th
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Categories: Science
Type: BOOK - Published: 2013-04-04 - Publisher: Courier Corporation

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Detailed enough to serve as both text and reference, this volume addresses topics vital to understanding high-power accelerators and high-brightness-charged par
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Pages: 634
Authors: Martin Reiser
Categories: Science
Type: BOOK - Published: 2008-09-26 - Publisher: John Wiley & Sons

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Although particle accelerators are the book's main thrust, it offers a broad synoptic description of beams which applies to a wide range of other devices such a
Electron Microscopy In Material Science
Language: en
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Categories: Science
Type: BOOK - Published: 2012-12-02 - Publisher: Elsevier

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Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said confe
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Language: en
Pages: 588
Authors: Stanley Humphries
Categories: Science
Type: BOOK - Published: 2013-09-11 - Publisher: Courier Corporation

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This authoritative text offers a unified, programmed summary of the principles underlying all charged particle accelerators — it also doubles as a reference c