Evaluation Of Device Performance And Hot Carrier Reliability For An N Channel Mosfet Using No Nitrided Gate Dielectric
Download and Read Evaluation Of Device Performance And Hot Carrier Reliability For An N Channel Mosfet Using No Nitrided Gate Dielectric full books in PDF, ePUB, and Kindle. Read online free Evaluation Of Device Performance And Hot Carrier Reliability For An N Channel Mosfet Using No Nitrided Gate Dielectric ebook anywhere anytime directly on your device. We cannot guarantee that every ebooks is available!
Evaluation of Device Performance and Hot-carrier Reliability for an N-channel MOSFET Using NO-nitrided Gate Dielectric
| Author | : Allen P. Lo |
| Publisher | : |
| Total Pages | : 182 |
| Release | : 1999 |
| Genre | : Integrated circuits |
| ISBN | : |
Download Evaluation of Device Performance and Hot-carrier Reliability for an N-channel MOSFET Using NO-nitrided Gate Dielectric Book in PDF, Epub and Kindle
Evaluation of Device Performance and Hot-carrier Reliability for an N-channel MOSFET Using NO-nitrided Gate Dielectric Related Books
Language: en
Pages: 182
Pages: 182
Type: BOOK - Published: 1999 - Publisher:
Language: en
Pages: 422
Pages: 422
Type: BOOK - Published: 1995 - Publisher:
Language: en
Pages: 182
Pages: 182
Type: BOOK - Published: 2017-01-27 - Publisher: Open Dissertation Press
This dissertation, "Hot-carrier-induced Instabilities in N-mosfet's With Thermally Nitrided Oxide as Gate Dielectric" by 馬志堅, Zhi-jian, Ma, was obtained f
Language: en
Pages: 345
Pages: 345
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
As device dimensions decrease, hot-carrier effects, which are due mainly to the presence of a high electric field inside the device, are becoming a major design
Language: en
Pages: 334
Pages: 334
Type: BOOK - Published: 1992 - Publisher:
