Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-scaled Circuits

Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-scaled Circuits
Author: Seyab
Publisher:
Total Pages:
Release: 2013
Genre:
ISBN: 9789461862099


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Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-scaled Circuits
Language: en
Pages:
Authors: Seyab
Categories:
Type: BOOK - Published: 2013 - Publisher:

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Bias Temperature Instability for Devices and Circuits
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Categories: Technology & Engineering
Type: BOOK - Published: 2013-10-22 - Publisher: Springer Science & Business Media

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This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias tempera
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Categories: Technology & Engineering
Type: BOOK - Published: 2015-08-05 - Publisher: Springer

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This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circui
Long-Term Reliability of Nanometer VLSI Systems
Language: en
Pages: 460
Authors: Sheldon Tan
Categories: Technology & Engineering
Type: BOOK - Published: 2019-09-12 - Publisher: Springer Nature

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This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems
Low-Power CMOS Wireless Communications
Language: en
Pages: 281
Authors: Samuel Sheng
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Low-Power CMOS Wireless Communications: A Wideband CDMA System Design focuses on the issues behind the development of a high-bandwidth, silicon complementary me