Advances in Time-of-flight Secondary Ion Mass Spectrometry for the Analysis of Single Cells on Sub-cellular Scale

Advances in Time-of-flight Secondary Ion Mass Spectrometry for the Analysis of Single Cells on Sub-cellular Scale
Author: Sadia Rabbani
Publisher:
Total Pages: 0
Release: 2010
Genre:
ISBN:


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Advances in Time-of-flight Secondary Ion Mass Spectrometry for the Analysis of Single Cells on Sub-cellular Scale
Language: en
Pages: 0
Advances in Time-of-flight Secondary Ion Mass Spectrometry for the Analysis of Single Cells on Sub-cellular Scale
Language: en
Pages: 225
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Language: en
Pages: 67
Authors: Sarah Fearn
Categories: Technology & Engineering
Type: BOOK - Published: 2015-10-16 - Publisher: Morgan & Claypool Publishers

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This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of m
Secondary Ion Mass Spectrometry
Language: en
Pages: 368
Authors: J. C. Vickerman
Categories: Business & Economics
Type: BOOK - Published: 1989 - Publisher: Oxford University Press, USA

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This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This a
The Practice of TOF-SIMS
Language: en
Pages: 267
Authors: Alan M. Spool
Categories: Technology & Engineering
Type: BOOK - Published: 2016-03-24 - Publisher: Momentum Press

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Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with su