Advanced X-Ray Characterization Techniques

Advanced X-Ray Characterization Techniques
Author: Zainal Arifin Ahmad
Publisher: Trans Tech Publications Ltd
Total Pages: 550
Release: 2012-12-13
Genre: Technology & Engineering
ISBN: 3038139416


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Volume is indexed by Thomson Reuters CPCI-S (WoS) X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.


Advanced X-Ray Characterization Techniques
Language: en
Pages: 550
Authors: Zainal Arifin Ahmad
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-13 - Publisher: Trans Tech Publications Ltd

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Volume is indexed by Thomson Reuters CPCI-S (WoS) X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerfu
X-ray Characterization of Materials
Language: en
Pages: 277
Authors: Eric Lifshin
Categories: Technology & Engineering
Type: BOOK - Published: 2008-07-11 - Publisher: John Wiley & Sons

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Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization
Advanced X-ray Techniques in Research and Industry
Language: en
Pages: 604
Authors: Ashok Kumar Singh
Categories: Medical
Type: BOOK - Published: 2005 - Publisher: IOS Press

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Papers presented at the seminar held in Defence Metallurgical Research Laboratory, Hyderabad India in 2003.
Advanced Techniques for Materials Characterization
Language: en
Pages: 528
Authors: A.K. Tyagi
Categories: Technology & Engineering
Type: BOOK - Published: 2009-01-02 - Publisher: Trans Tech Publications Ltd

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Volume is indexed by Thomson Reuters BCI (WoS). Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chem
Characterization of Crystal Growth Defects by X-Ray Methods
Language: en
Pages: 615
Authors: B.K. Tanner
Categories: Science
Type: BOOK - Published: 2013-04-17 - Publisher: Springer Science & Business Media

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This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the Univers