X-Ray Scattering of Soft Matter

X-Ray Scattering of Soft Matter
Author: Norbert Stribeck
Publisher: Springer Science & Business Media
Total Pages: 251
Release: 2007-05-16
Genre: Technology & Engineering
ISBN: 3540698566


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This manual is a useful ready-reference guide to the analytical power of modern X-ray scattering in the field of soft matter. The author describes simple tools that can elucidate the mechanisms of structure evolution in the studied materials, and follows this up with a step-by-step guide to more advanced methods. Data analysis based on clear, unequivocal results is rendered simple and straightforward – with a stress on careful planning of experiments and adequate recording of all required data.


X-Ray Scattering of Soft Matter
Language: en
Pages: 251
Authors: Norbert Stribeck
Categories: Technology & Engineering
Type: BOOK - Published: 2007-05-16 - Publisher: Springer Science & Business Media

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This manual is a useful ready-reference guide to the analytical power of modern X-ray scattering in the field of soft matter. The author describes simple tools
High-Resolution X-Ray Scattering
Language: en
Pages: 432
Authors: Ullrich Pietsch
Categories: Technology & Engineering
Type: BOOK - Published: 2004-08-27 - Publisher: Springer Science & Business Media

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During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industr
X-ray Scattering from Semiconductors
Language: en
Pages: 303
Authors: Paul F. Fewster
Categories: Science
Type: BOOK - Published: 2000 - Publisher: World Scientific

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X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques
Thin Film Analysis by X-Ray Scattering
Language: en
Pages: 378
Authors: Mario Birkholz
Categories: Technology & Engineering
Type: BOOK - Published: 2006-05-12 - Publisher: John Wiley & Sons

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With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of m
X-Ray Diffraction Crystallography
Language: en
Pages: 320
Authors: Yoshio Waseda
Categories: Technology & Engineering
Type: BOOK - Published: 2011-03-18 - Publisher: Springer Science & Business Media

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X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the ato