X-Ray Diffraction Topography

X-Ray Diffraction Topography
Author: B. K. Tanner
Publisher: Elsevier
Total Pages: 189
Release: 2013-10-22
Genre: Science
ISBN: 1483187683


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X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang’s method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.


X-Ray Diffraction Topography
Language: en
Pages: 189
Authors: B. K. Tanner
Categories: Science
Type: BOOK - Published: 2013-10-22 - Publisher: Elsevier

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X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of
High Resolution X-Ray Diffractometry And Topography
Language: en
Pages: 263
Authors: D.K. Bowen
Categories: Technology & Engineering
Type: BOOK - Published: 1998-02-05 - Publisher: CRC Press

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The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these mat
X-Ray and Neutron Dynamical Diffraction
Language: en
Pages: 419
Authors: André Authier
Categories: Science
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applicat
X-ray Diffraction Topography
Language: en
Pages: 174
Authors: Brian Keith Tanner
Categories:
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Characterization of Crystal Growth Defects by X-Ray Methods
Language: en
Pages: 615
Authors: B.K. Tanner
Categories: Science
Type: BOOK - Published: 2013-04-17 - Publisher: Springer Science & Business Media

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This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the Univers