Test Generation Of Crosstalk Delay Faults In Vlsi Circuits
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Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author | : S. Jayanthy |
Publisher | : Springer |
Total Pages | : 161 |
Release | : 2018-09-20 |
Genre | : Technology & Engineering |
ISBN | : 981132493X |
Download Test Generation of Crosstalk Delay Faults in VLSI Circuits Book in PDF, Epub and Kindle
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
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