Special Issue, X-ray Topography and High Resolution Diffraction

Special Issue, X-ray Topography and High Resolution Diffraction
Author:
Publisher:
Total Pages: 209
Release: 1993
Genre:
ISBN:
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Special Issue, X-ray Topography and High Resolution Diffraction
Language: en
Pages: 209

Special Issue, X-ray Topography and High Resolution Diffraction

Authors:
Categories:
Type: BOOK - Published: 1993 - Publisher:

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Special Issue on High Resolution X-ray Diffraction and Topography
Language: en
Pages: 218

Special Issue on High Resolution X-ray Diffraction and Topography

Authors: Conference on High Resolution X-Ray Diffraction and Topography. 5, 2000, Ustroń
Categories:
Type: BOOK - Published: 2001 - Publisher:

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Special Issue on X-ray Imaging and High-resolution Diffraction
Language: en
Pages: 252

Special Issue on X-ray Imaging and High-resolution Diffraction

Authors:
Categories: X-ray crystallography
Type: BOOK - Published: 2003 - Publisher:

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High Resolution X-Ray Diffractometry And Topography
Language: en
Pages: 263

High Resolution X-Ray Diffractometry And Topography

Authors: D.K. Bowen
Categories: Technology & Engineering
Type: BOOK - Published: 1998-02-05 - Publisher: CRC Press

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The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these mat
X-ray Topography and High Resolution Diffraction
Language: en
Pages:

X-ray Topography and High Resolution Diffraction

Authors: Rainer Köhler
Categories:
Type: BOOK - Published: 1995 - Publisher:

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