SEM Microcharacterization of Semiconductors

SEM Microcharacterization of Semiconductors
Author: D. B. Holt
Publisher: Academic Press
Total Pages: 467
Release: 2013-10-22
Genre: Technology & Engineering
ISBN: 1483288676


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Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope.


SEM Microcharacterization of Semiconductors
Language: en
Pages: 467
Authors: D. B. Holt
Categories: Technology & Engineering
Type: BOOK - Published: 2013-10-22 - Publisher: Academic Press

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Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Language: en
Pages: 463
Authors: Patrick Echlin
Categories: Medical
Type: BOOK - Published: 2013-06-29 - Publisher: Springer Science & Business Media

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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh Univ
Optical Characterization of Semiconductors
Language: en
Pages: 229
Authors: Sidney Perkowitz
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-02 - Publisher: Elsevier

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This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scatterin
Semiconductor Materials
Language: en
Pages: 233
Authors: B.G. Yacobi
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-18 - Publisher: Springer Science & Business Media

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The technological progress is closely related to the developments of various materials and tools made of those materials. Even the different ages have been defi
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
Language: en
Pages: 415
Authors: Charles E. Lyman
Categories: Science
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcompositi