Scanning Probe Microscopy of Functional Materials
Language: en
Pages: 563
Authors: Sergei V. Kalinin
Categories: Technology & Engineering
Type: BOOK - Published: 2010-12-13 - Publisher: Springer Science & Business Media

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The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Language: en
Pages: 503
Authors: Paula M. Vilarinho
Categories: Science
Type: BOOK - Published: 2006-06-15 - Publisher: Springer Science & Business Media

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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has co
Scanning Probe Microscopy of Functional Materials
Language: en
Pages: 576
Authors: Sergei V Kalinin
Categories:
Type: BOOK - Published: 2016-04-01 - Publisher: Springer

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Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a
Scanning Probe Microscopy of Functional Materials
Language: en
Pages: 555
Authors: Sergei V. Kalinin
Categories: Technology & Engineering
Type: BOOK - Published: 2010-12-10 - Publisher: Springer

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The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization
Nanoscale Phenomena in Functional Materials by Scanning Probe Microscopy
Language: en
Pages: 123
Authors:
Categories: Electrical engineering
Type: BOOK - Published: 2008 - Publisher:

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