Scanning Probe Microscopy
Language: en
Pages: 375
Authors: Bert Voigtländer
Categories: Technology & Engineering
Type: BOOK - Published: 2015-02-24 - Publisher: Springer

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This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operat
Scanning Probe Microscopy
Language: en
Pages: 330
Authors: Ernst Meyer
Categories: Science
Type: BOOK - Published: 2021-05-31 - Publisher: Springer Nature

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Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the expe
Scanning Probe Microscopy
Language: en
Pages: 1002
Authors: Sergei V. Kalinin
Categories: Technology & Engineering
Type: BOOK - Published: 2007-04-03 - Publisher: Springer Science & Business Media

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This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing
Scanning Probe Microscopes
Language: en
Pages: 450
Authors: K. S. Birdi
Categories: Science
Type: BOOK - Published: 2003-02-26 - Publisher: CRC Press

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Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes, and demonstrates the most widely used microscope in the family of microsc
Roadmap of Scanning Probe Microscopy
Language: en
Pages: 207
Authors: Seizo Morita
Categories: Technology & Engineering
Type: BOOK - Published: 2006-12-30 - Publisher: Springer Science & Business Media

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Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for