Principles of Electron Optics

Principles of Electron Optics
Author: Peter W. Hawkes
Publisher: Academic Press
Total Pages: 599
Release: 2012-12-02
Genre: Science
ISBN: 0080962432


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This is a complete handbook and reference volume which covers everything that one needs to know about electron optics. It is a comprehensive coverage of theoretical background and modern computing methods. It contains a detailed and unique account of numerical methods and an extensive bibliography.


Principles of Electron Optics
Language: en
Pages: 599
Authors: Peter W. Hawkes
Categories: Science
Type: BOOK - Published: 2012-12-02 - Publisher: Academic Press

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This is a complete handbook and reference volume which covers everything that one needs to know about electron optics. It is a comprehensive coverage of theoret
Principles of Electron Optics, Volume 1
Language: en
Pages: 729
Authors: Peter W. Hawkes
Categories: Science
Type: BOOK - Published: 2017-10-29 - Publisher: Elsevier

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Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range
Principles of Electron Optics
Language: en
Pages: 755
Authors: Peter W. Hawkes
Categories: Science
Type: BOOK - Published: 2012-12-02 - Publisher: Academic Press

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The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes
Principles of Electron Optics, Volume 1
Language: en
Pages: 0
Authors: Peter W. Hawkes
Categories: Science
Type: BOOK - Published: 2017-10-29 - Publisher: Academic Press

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Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range
Physical Principles of Electron Microscopy
Language: en
Pages: 224
Authors: Ray Egerton
Categories: Technology & Engineering
Type: BOOK - Published: 2011-02-11 - Publisher: Springer Science & Business Media

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus