Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files

Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files
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Total Pages: 43
Release: 2007
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ISBN:
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Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files
Language: en
Pages: 43

Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files

Authors:
Categories:
Type: BOOK - Published: 2007 - Publisher:

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The Practice of TOF-SIMS
Language: en
Pages: 267

The Practice of TOF-SIMS

Authors: Alan M. Spool
Categories: Technology & Engineering
Type: BOOK - Published: 2016-03-24 - Publisher: Momentum Press

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Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with su
Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry
Language: en
Pages: 195

Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry

Authors: Danica Heller-Krippendorf
Categories: Science
Type: BOOK - Published: 2019-10-31 - Publisher: Springer Nature

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Danica Heller-Krippendorf develops concepts and approaches optimizing the applicability of MVA on data sets from an industrial context. They enable more time-ef
Time-of-flight Secondary Ion Mass Spectrometry
Language: en
Pages:

Time-of-flight Secondary Ion Mass Spectrometry

Authors: Joanna Lee
Categories:
Type: BOOK - Published: 2011 - Publisher:

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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative techno
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Language: en
Pages: 67

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Authors: Sarah Fearn
Categories: Technology & Engineering
Type: BOOK - Published: 2015-10-16 - Publisher: Morgan & Claypool Publishers

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This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of m