Microelectronics Failure Analysis

Microelectronics Failure Analysis
Author:
Publisher: ASM International
Total Pages: 813
Release: 2004-01-01
Genre: Technology & Engineering
ISBN: 0871708043


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For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron


Microelectronics Failure Analysis
Language: en
Pages: 813
Authors:
Categories: Technology & Engineering
Type: BOOK - Published: 2004-01-01 - Publisher: ASM International

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For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the pr
Microelectronics Fialure Analysis Desk Reference, Seventh Edition
Language: en
Pages: 750
Authors: Tejinder Gandhi
Categories: Technology & Engineering
Type: BOOK - Published: 2019-11-01 - Publisher: ASM International

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The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM I
Microelectronic Failure Analysis
Language: en
Pages: 160
Authors:
Categories: Technology & Engineering
Type: BOOK - Published: 2002-01-01 - Publisher: ASM International

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Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully s
Microelectronic Failure Analysis
Language: en
Pages: 263
Authors: Thomas W. Lee
Categories: Electronic apparatus and appliances
Type: BOOK - Published: 1991 - Publisher:

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Microelectronic Failure Analysis
Language: en
Pages: 664
Authors: Richard J. Ross
Categories: Education
Type: BOOK - Published: 1999 - Publisher: ASM International(OH)

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Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics inclu