Measurement Techniques For Radio Frequency Nanoelectronics
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Measurement Techniques for Radio Frequency Nanoelectronics
Author | : T. Mitch Wallis |
Publisher | : Cambridge University Press |
Total Pages | : 329 |
Release | : 2017-09-14 |
Genre | : Science |
ISBN | : 1107120683 |
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Featuring numerous examples linking theoretical concepts with real-world applications, this practical, cross-disciplinary guide will help you understand the fundamentals of radio frequency measurement of nanoscale devices. -- Résumé abrégé du livre.
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