HRTEM and EELS Studies of Nanoscale Structured Electronic Materials

HRTEM and EELS Studies of Nanoscale Structured Electronic Materials
Author: Jiaming Zhang
Publisher:
Total Pages: 338
Release: 2007
Genre: Nanocrystals
ISBN:


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HRTEM and EELS Studies of Nanoscale Structured Electronic Materials
Language: en
Pages: 338
Authors: Jiaming Zhang
Categories: Nanocrystals
Type: BOOK - Published: 2007 - Publisher:

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Characterization of Nanostructures
Language: en
Pages: 353
Authors: Sverre Myhra
Categories: Science
Type: BOOK - Published: 2012-06-12 - Publisher: CRC Press

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The techniques and methods that can be applied to materials characterization on the microscale are numerous and well-established. Divided into two parts, Charac
Characterization of Electrochemical and Electronic Materials by in Situ and Aberration-corrected Transmission Electron Microscopy
Language: en
Pages: 426
Authors: Megan Elizabeth Holtz
Categories:
Type: BOOK - Published: 2017 - Publisher:

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Scanning transmission electron microscopy (STEM) is a key tool in the advancement of materials science. As nanoscale materials and atomically sharp interfaces b
Nanometrology Using the Transmission Electron Microscope
Language: en
Pages: 69
Authors: Vlad Stolojan
Categories: Technology & Engineering
Type: BOOK - Published: 2015-10-12 - Publisher: Morgan & Claypool Publishers

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The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and elec
Microscopy of Semiconducting Materials 2007
Language: en
Pages: 504
Authors: A.G. Cullis
Categories: Technology & Engineering
Type: BOOK - Published: 2008-12-02 - Publisher: Springer Science & Business Media

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This volume contains invited and contributed papers presented at the conference on ‘Microscopy of Semiconducting Materials’ held at the University of Cambri