Hierarchical Modeling and test generation for digital circuits

Hierarchical Modeling and test generation for digital circuits
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Total Pages:
Release: 1990
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Hierarchical Modeling and test generation for digital circuits
Language: en
Pages:

Hierarchical Modeling and test generation for digital circuits

Authors:
Categories:
Type: BOOK - Published: 1990 - Publisher:

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Hierarchical Modeling for VLSI Circuit Testing
Language: en
Pages: 168

Hierarchical Modeling for VLSI Circuit Testing

Authors: Debashis Bhattacharya
Categories: Computers
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the alm
A hierarchical model of logic circuits for test generation
Language: en
Pages:

A hierarchical model of logic circuits for test generation

Authors: Université de Montréal. Département d'Informatique et de Recherche Opérationnelle
Categories:
Type: BOOK - Published: 1980 - Publisher:

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Testing of Digital Systems
Language: en
Pages: 1022

Testing of Digital Systems

Authors: N. K. Jha
Categories: Computers
Type: BOOK - Published: 2003-05-08 - Publisher: Cambridge University Press

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Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wi
Hierarchical Test Generation for Digital Circuits Represented by Decision Diagrams
Language: en
Pages: 108

Hierarchical Test Generation for Digital Circuits Represented by Decision Diagrams

Authors: Jaan Raik
Categories: Decision trees
Type: BOOK - Published: 2001 - Publisher:

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