Evaluation Of Device Performance And Hot Carrier Reliability For An N Channel Mosfet Using No Nitrided Gate Dielectric
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Evaluation of Device Performance and Hot-carrier Reliability for an N-channel MOSFET Using NO-nitrided Gate Dielectric
Author | : Allen P. Lo |
Publisher | : |
Total Pages | : 182 |
Release | : 1999 |
Genre | : Integrated circuits |
ISBN | : |
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