Epitaxial Growth and Characterization of Si(l-x)Ge(x) Materials and Devices

Epitaxial Growth and Characterization of Si(l-x)Ge(x) Materials and Devices
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Total Pages: 24
Release: 1994
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The current program of research was aimed at understanding the issues related to growth and doping of SiGe/Si heterostructures by gas-source MBE, studying the transport properties of the alloys, determining the fundamental material parameters and designing and demonstrating electronic and optoelectronic devices. The specific electronic device is the HBT with high Ge-containing base layers, and the optoelectronic devices are detectors, photoreceivers, and electro-optic modulators. The overall objective is to demonstrate, reliably and reproducibly, the feasibility of integrating SeGe-based optoelectronics with Si-based VLSI technology. We summarize below some of the highlights of the program related to work done in the last year. jg p.3.


Epitaxial Growth and Characterization of Si(l-x)Ge(x) Materials and Devices
Language: en
Pages: 24
Authors:
Categories:
Type: BOOK - Published: 1994 - Publisher:

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The current program of research was aimed at understanding the issues related to growth and doping of SiGe/Si heterostructures by gas-source MBE, studying the t
Epitaxial Growth and Characterization of Si(1-x)Ge(x) Materials and Devices
Language: en
Pages: 38
Authors: Pallab Bhattacharya
Categories:
Type: BOOK - Published: 1997 - Publisher:

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The objectives of this project were the understanding of heteroepitaxial growth of SiGe/Si, dislocation control for highly mismatched layers, and the applicatio
Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes
Language: en
Pages: 568
Authors: Bernd O. Kolbesen (Chemiker.)
Categories: Technology & Engineering
Type: BOOK - Published: 1999 - Publisher: The Electrochemical Society

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Crystal and Epitaxial Growth
Language: en
Pages: 282
Authors: V. Alexander Stefan, Editor
Categories: Science
Type: BOOK - Published: 2002 - Publisher: Stefan University Press

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Epitaxial Growth and Characterization of SiC for High Power Devices
Language: en
Pages: 75
Authors:
Categories:
Type: BOOK - Published: 2009 - Publisher:

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