2002 18th IEEE Semiconductor Thermal Measurement and Management Symposium

2002 18th IEEE Semiconductor Thermal Measurement and Management Symposium
Author: IEEE Components, Manufacturing And Technology Society Staff
Publisher:
Total Pages: 210
Release: 2002
Genre: Technology & Engineering
ISBN: 9780780373273


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This volume originates from the 18th Symposium on Semiconductor Thermal Measurement and Management and examines components. It covers topics including: advances in compact models; package and material characterization; system level analysis; and liquid cooling application."