Test Generation of Crosstalk Delay Faults in VLSI Circuits

Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author: S. Jayanthy
Publisher: Springer
Total Pages: 161
Release: 2018-09-20
Genre: Technology & Engineering
ISBN: 981132493X


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This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.


Test Generation of Crosstalk Delay Faults in VLSI Circuits
Language: en
Pages: 161
Authors: S. Jayanthy
Categories: Technology & Engineering
Type: BOOK - Published: 2018-09-20 - Publisher: Springer

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This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk
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In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, t
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Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increase
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