Defects in SiO2 and Related Dielectrics: Science and Technology
Language: en
Pages: 619
Authors: Gianfranco Pacchioni
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to
Defects in HIgh-k Gate Dielectric Stacks
Language: en
Pages: 495
Authors: Evgeni Gusev
Categories: Technology & Engineering
Type: BOOK - Published: 2006-02-15 - Publisher: Springer Science & Business Media

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The goal of this NATO Advanced Research Workshop (ARW) entitled “Defects in Advanced High-k Dielectric Nano-electronic Semiconductor Devices”, which was hel
The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2
Language: en
Pages: 505
Authors: B.E. Deal
Categories: Science
Type: BOOK - Published: 2013-11-09 - Publisher: Springer Science & Business Media

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The first international symposium on the subject "The Physics and Chemistry of Si02 and the Si-Si02 Interface," organized in association with the Electrochemica
Nano and Giga Challenges in Microelectronics
Language: en
Pages: 264
Authors: J. Greer
Categories: Technology & Engineering
Type: BOOK - Published: 2003-10-24 - Publisher: Elsevier

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The book is designed as an introduction for engineers and researchers wishing to obtain a fundamental knowledge and a snapshot in time of the cutting edge in te
Spectroscopy for Materials Characterization
Language: en
Pages: 500
Authors: Simonpietro Agnello
Categories: Technology & Engineering
Type: BOOK - Published: 2021-09-08 - Publisher: John Wiley & Sons

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SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface scie