Defect Engineering in Semiconductor Growth, Processing, and Device Technology

Defect Engineering in Semiconductor Growth, Processing, and Device Technology
Author: S. Ashok
Publisher:
Total Pages: 1180
Release: 1992
Genre: Crystals
ISBN:


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Proceedings of the San Francisco meeting of April-May 1992. Papers emphasize deliberate and controlled introduction and manipulation of defects in order to engineer some desired properties in semiconductor materials and devices. Topics include: defects in bulk crystals, and in thin films; defect characterization; hydrogen interaction; processing induction of defects; quantum wells; ion implantation. Annotation copyright by Book News, Inc., Portland, OR


Defect Engineering in Semiconductor Growth, Processing, and Device Technology
Language: en
Pages: 1180
Authors: S. Ashok
Categories: Crystals
Type: BOOK - Published: 1992 - Publisher:

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Proceedings of the San Francisco meeting of April-May 1992. Papers emphasize deliberate and controlled introduction and manipulation of defects in order to engi
Defect Engineering in Semiconductor Growth, Processing, and Device Technology
Language: en
Pages: 1176
Authors: S. Ashok
Categories: Technology & Engineering
Type: BOOK - Published: 1992 - Publisher:

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Proceedings of the San Francisco meeting of April-May 1992. Papers emphasize deliberate and controlled introduction and manipulation of defects in order to engi
Symposium Proceedings Defect and Impurity Engineered Semiconductors and Devices Held in San Francisco, California on 17-21 April 1995
Language: en
Pages: 1052
Authors:
Categories:
Type: BOOK - Published: 1996 - Publisher:

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This volume results from a symposium held at the 1995 MRS Spring Meeting, April 17-21, in San Francisco. The symposium, bearing the title of this volume, follow
Gettering Anf Defect Engineering in Semiconductor Technology IX
Language: en
Pages: 850
Authors:
Categories:
Type: BOOK - Published: 2001 - Publisher:

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Gettering and Defect Engineering in Semiconductor Technology are discussed here,with particular emphasis being placed on device applications. Fundamental aspect
Defects and Properties of Semiconductors
Language: en
Pages: 280
Authors: J. Chikawa
Categories: Science
Type: BOOK - Published: 1987-03-31 - Publisher: Springer

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This volume contains nearly all of the papers presented at the Symposium on "Defects and Qualities of Semiconductors" which was held in Tokyo on May 17-18, 1984