Application of Time-of-flight Secondary Ion Mass Spectrometry to Cellular Analysis

Application of Time-of-flight Secondary Ion Mass Spectrometry to Cellular Analysis
Author: Matthew J. Baker
Publisher:
Total Pages: 220
Release: 2007
Genre:
ISBN:


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Application of Time-of-flight Secondary Ion Mass Spectrometry to Cellular Analysis
Language: en
Pages: 220
Authors: Matthew J. Baker
Categories:
Type: BOOK - Published: 2007 - Publisher:

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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Language: en
Pages: 67
Authors: Sarah Fearn
Categories: Technology & Engineering
Type: BOOK - Published: 2015-10-16 - Publisher: Morgan & Claypool Publishers

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This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of m
Advances in Time-of-flight Secondary Ion Mass Spectrometry for the Analysis of Single Cells on Sub-cellular Scale
Language: en
Pages: 0
Advances in Time-of-flight Secondary Ion Mass Spectrometry for the Analysis of Single Cells on Sub-cellular Scale
Language: en
Pages: 225
The Practice of TOF-SIMS
Language: en
Pages: 0
Authors: Alan M. Spool
Categories: Secondary ion mass spectrometry
Type: BOOK - Published: 2016 - Publisher:

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Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that can provide information about composition with