Analysis Of The Gan Sapphire Thick Films Processed By Iodine Vapor Phase Growth By Transmission Electron Microscopy And Atomic Force Microscopy
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Analysis of the GaN-sapphire Thick Films, Processed by Iodine Vapor Phase Growth by Transmission Electron Microscopy and Atomic Force Microscopy
| Author | : Praveena M. Bhaskara |
| Publisher | : |
| Total Pages | : 186 |
| Release | : 2001 |
| Genre | : Atomic force microscopy |
| ISBN | : |
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