A Unified Approach for Timing Verification and Delay Fault Testing
Language: en
Pages: 164
Authors: Mukund Sivaraman
Categories: Technology & Engineering
Type: BOOK - Published: 2012-09-17 - Publisher: Springer Science & Business Media

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Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temp
Delay Fault Testing for VLSI Circuits
Language: en
Pages: 201
Authors: Angela Krstic
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, t
Dependable Multicore Architectures at Nanoscale
Language: en
Pages: 294
Authors: Marco Ottavi
Categories: Technology & Engineering
Type: BOOK - Published: 2017-08-28 - Publisher: Springer

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This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technol
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 690
Authors: M. Bushnell
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
A Designer’s Guide to Built-In Self-Test
Language: en
Pages: 338
Authors: Charles E. Stroud
Categories: Technology & Engineering
Type: BOOK - Published: 2005-12-27 - Publisher: Springer Science & Business Media

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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's