A hierarchical model of logic circuits for test generation

A hierarchical model of logic circuits for test generation
Author: Université de Montréal. Département d'Informatique et de Recherche Opérationnelle
Publisher:
Total Pages:
Release: 1980
Genre:
ISBN:
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A hierarchical model of logic circuits for test generation
Language: en
Pages:

A hierarchical model of logic circuits for test generation

Authors: Université de Montréal. Département d'Informatique et de Recherche Opérationnelle
Categories:
Type: BOOK - Published: 1980 - Publisher:

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Hierarchical Modeling for VLSI Circuit Testing
Language: en
Pages: 168

Hierarchical Modeling for VLSI Circuit Testing

Authors: Debashis Bhattacharya
Categories: Computers
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the alm
Hierarchical Modeling and test generation for digital circuits
Language: en
Pages:

Hierarchical Modeling and test generation for digital circuits

Authors:
Categories:
Type: BOOK - Published: 1990 - Publisher:

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Test Generation for Combinational Logic Circuits Using Information Theory
Language: en
Pages: 72

Test Generation for Combinational Logic Circuits Using Information Theory

Authors: Yusuf Murat Erten
Categories:
Type: BOOK - Published: 1983 - Publisher:

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An Introduction to Logic Circuit Testing
Language: en
Pages: 111

An Introduction to Logic Circuit Testing

Authors: Parag K. Lala
Categories: Computers
Type: BOOK - Published: 2009 - Publisher: Morgan & Claypool Publishers

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An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/syste